S. Charvet

Spectroscopic ellipsometry analyses of sputtered Si/SiO2 nanostructures

S. Charvet, R. Madelon, F. Gourbilleau et al. · Journal of Applied Physics · 1999 · 69 citations

Optical Materials, Engineering, Optoelectronic Devices +16

Nanocrystalline silicon thin films prepared by radiofrequency magnetron sputtering

Cristiana Gonçalves, S. Charvet, A. Zeinert et al. · Thin Solid Films · 2002 · 51 citations

Materials Science, Engineering, Radiofrequency Magnetron +8

Elaboration and electrochemical characterization of nitrogenated amorphous carbon films

A. Lagrini, C. Deslouis, H. Cachet et al. · Electrochemistry Communications · 2004 · 49 citations · Full text

Materials Science, Engineering, Porous Carbon +4

Opto-electronic properties of bismuth oxide films presenting different crystallographic phases

Celia L. Gómez, Osmary Depablos‐Rivera, Phaedra Silva-Bermúdez et al. · Thin Solid Films · 2015 · 44 citations

Materials Science, Ii-vi Semiconductor, Optical Materials +6

Correlation between plasma parameters, microstructure and optical properties of sputtering magnetron CNx films

M. Lejeune, O. Durand-Drouhin, S. Charvet et al. · Thin Solid Films · 2003 · 37 citations

Materials Science, Magnetism, Magnetron Cnx Films +10