V.K. Dham

Electrical properties of nitrided-oxide systems for use in gate dielectrics and EEPROM

Sz‐Nian Lai, J. Lee, V.K. Dham · 1983 · 72 citations

Materials Science, Gate Dielectrics, Electrical Engineering +15

High-voltage regulation and process considerations for high-density 5 V-only E/sup 2/PROM's

D. Oto, V.K. Dham, K.H. Gudger et al. · IEEE Journal of Solid-State Circuits · 1983 · 23 citations

Engineering, Vlsi Design, Power Electronics +18

Comparison and trends in today's dominant E<sup>2</sup>technologies

Sz‐Nian Lai, V.K. Dham, D.C. Guterman · 1986 · 17 citations

Engineering, Vlsi Design, Education +18

Oxidized-nitridized oxide (ONO) for high performance EEPROMs

T.T.L. Chang, H.S. Jones, C.S. Jenq et al. · 1982 · 10 citations