H. Holmberg

Detection of low-level copper contamination in p-type silicon by means of microwave photoconductive decay measurements

Marko Yli‐Koski, Martti Palokangas, Antti Haarahiltunen et al. · Journal of Physics Condensed Matter · 2002 · 16 citations

Semiconductors, Electrical Engineering, Copper Oxide Materials +15

Electrical transport in Mn‐doped GaAs pn‐diodes

H. Holmberg, N. Lebedeva, P. Kuivalainen et al. · physica status solidi (a) · 2007 · 14 citations

Magnetic Properties, Engineering, Semiconductor Materials +19

Interplay between the exchange and Coulomb interactions in a ferromagnetic semiconductor quantum dot

N. Lebedeva, H. Holmberg, P. Kuivalainen · Physical Review B · 2008 · 13 citations

Charge Excitations, Engineering, Spin Systems +23

Large magnetoresistance in a ferromagnetic GaMnAs/GaAs Zener diode

H. Holmberg, N. Lebedeva, Joni Ikonen et al. · Europhysics Letters (EPL) · 2005 · 10 citations