Y. Liu

Analytical and numerical depth resolution functions in sputter profiling

S. Hofmann, Y. Liu, Jiangyong Wang et al. · Applied Surface Science · 2014 · 32 citations

Radar, Engineering, Synthetic Aperture Radar +9

Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper

Y. Liu, Wei Jian, Jiangyong Wang et al. · Applied Surface Science · 2015 · 24 citations

Materials Engineering, Materials Science, Surface Characterization +6

Influence of non-Gaussian roughness on sputter depth profiles

Y. Liu, Wei Jian, Jiangyong Wang et al. · Applied Surface Science · 2013 · 21 citations

Engineering, Numerical Simulation, Noise +4

Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling

Jiangyong Wang, Y. Liu, S. Hofmann et al. · Surface and Interface Analysis · 2011 · 20 citations

Nonstationary Atomic Mixing, Ion Implantation, Engineering +15

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

X. L. Yan, Y. Liu, H.C. Swart et al. · Applied Surface Science · 2015 · 19 citations

Materials Science, Materials Engineering, Surface Characterization +12