W. Possart

Publications

168

Citations

H-Index

1995

Active since

Affiliations

Fraunhofer Institute for Manufacturing Technology and Advanced Materials(Current)

W. Possart is an author at Fraunhofer Institute for Manufacturing Technology and Advanced Materials specializing in applied physics, engineering, and materials science.

Top concepts

EngineeringApplied PhysicsMaterial ScienceSurface ScienceChemistryThin FilmsPolymer ScienceMicrofabricationImagingMedicine

Publications per year

1995–1996

Publications

Imaging elastic sample properties with an atomic force microscope operating in the tapping mode

R. Höper, T. Gesang, W. Possart et al. · Ultramicroscopy · 1995 · 66 citations

Tapping Mode, Engineering, Microscopy +13

Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin polymer films

T. Gesang, D. Fanter, R. Höper et al. · Surface and Interface Analysis · 1995 · 30 citations

Atomic Force Microscopy, Engineering, Ultrathin Polymer Films +19

Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

S. Dieckhoff, V. Schlett, W. Possart et al. · Applied Surface Science · 1996 · 24 citations

Silicon Wafers, Photoelectron Spectroscopy, Electron Spectroscopy +5

Studies on the Interphase of a Model Adhesive Joint

W. Possart, D. Fanter, S. Dieckhoff et al. · The Journal of Adhesion · 1996 · 15 citations

Organic film formation investigated by atomic force microscopy on the nanometre scale

T. Gesang, R. Höper, S. Dieckhoff et al. · Thin Solid Films · 1995 · 12 citations

Materials Science, Atomic Force Microscopy, Nanometre Scale +10

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