S. Becker

Impact of organic contamination on 1064-nm laser-induced damage threshold of dielectric mirrors

Alexandre Pereira, Jean-Guillaume Coutard, S. Becker et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006 · 21 citations

Optical Materials, Laser Damage Threshold, Engineering +25

Latest pixel size reduction of uncooled IR-FPA at CEA, LETI

S. Becker, P. Imperinetti, Jean-Jacques Yon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 20 citations

Laser-induced contamination of silica coatings in vacuum

S. Becker, Alexandre Pereira, Philippe Bouchut et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006 · 17 citations

Optical Materials, Engineering, Optical Coatings +16

A [10°C; 70°C] 640×480 17µm pixel pitch TEC-less IR bolometer imager with below 50mK and below 4V power supply

B. Dupont, Antoine Dupret, S. Becker et al. · 2013 · 14 citations

Engineering, Measurement, Education +18

Current progress on pixel level packaging for uncooled IRFPA

Geoffroy Dumont, W. Rabaud, J. J. Yon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 12 citations

Engineering, Optical Testing, Image Sensor +17