J. F. Graczyk

Evidence of Voids Within the As-Deposited Structure of Glassy Silicon

Steven C. Moss, J. F. Graczyk · Physical Review Letters · 1969 · 359 citations

Materials Science, Engineering, Physics +13

An Electron Microscope Investigation of the Structure of Some Amorphous Materials

P. Chaudhari, J. F. Graczyk, S. R. Herd · physica status solidi (b) · 1972 · 60 citations

Engineering, Microscopy, Electron Diffraction +16

Coherent Scattering in a Random-Network Model for Amorphous Solids

P. Chaudhari, J. F. Graczyk, H. P. Charbnau · Physical Review Letters · 1972 · 58 citations

Materials Science, Random-network Model, Engineering +10

Scanning Electron Diffraction Attachment with Electron Energy Filtering

J. F. Graczyk, Steven C. Moss · Review of Scientific Instruments · 1969 · 55 citations · Full text

Engineering, Microscopy, Electron Diffraction +17

A Scanning Electron Diffraction Study of Vapor‐Deposited and Ion Implanted Thin Films of Ge (I)

J. F. Graczyk, P. Chaudhari · physica status solidi (b) · 1973 · 55 citations