Sérgio L. Morelhão

Author

Sérgio L. Morelhão

Also Known As

Calligaris, G. A., Morelhao, S. L., Morelhao, Sergio L., Morelhão, S. L., Morelhão, Sergio Luiz, Morelhão, Sérgio L., Morelhão, Sérgio Luiz, S L Morelhão, S. L. Morelhao, S. L. Morelhão

154

Publications

1.1K

Citations

H-Index

Concepts

All Affiliations

Universidade de São Paulo Universidade Estadual de Campinas (UNICAMP)Instituto Nacional de Pesquisas Espaciais University of Würzburg Brazilian Synchrotron Light Laboratory

About

Sérgio L. Morelhão is an author at Universidade de São Paulo specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	18	34	794
2	Applied Physics	18	33	801
3	Natural Sciences	8	8	183
4	Health Sciences	2	2	59
5	Medicine	1	1	12

Sérgio L. Morelhão

Publications

873

Citations

H-Index

Page 1

	Year	Citations
X-ray Multiple Diffraction Phenomenon in the Evaluation of Semiconductor Crystalline Perfection Sérgio L. Morelhão, Lisandro Pavie Cardoso Journal of Applied Crystallography EngineeringCrystalline PerfectionMd BeamsSemiconductor Crystalline PerfectionSemiconductors	1996	52
Structural properties of Bi2Te3 topological insulator thin films grown by molecular beam epitaxy on (111) BaF2 substrates Celso I. Fornari, P. H. O. Rappl, Sérgio L. Morelhão, Journal of Applied Physics EngineeringCrystal Growth TechnologyBi2te3 FilmsTopological Insulator BismuthBaf2 Substrates	2016	50
Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors Mirian A.F. Hayashi, Sérgio L. Morelhão, L. H. Avanci, Applied Physics Letters X-ray SpectroscopyEngineeringElectron DiffractionX-ray ImagingSemiconductors	1997	47
Enhanced X-Ray Phase Determination by Three-Beam Diffraction Sérgio L. Morelhão, S. Kycia Physical Review Letters Materials ScienceEngineeringPhysicsNatural SciencesSpectroscopy	2002	42
Strength tuning of multiple waves in crystals Sérgio L. Morelhão, L. H. Avanci Acta Crystallographica Section A Foundations of Crystallography PhotonicsEngineeringSynchrotron Radiation ResearchPhysicsCrystal Material	2001	42
Investigation of Bragg surface diffraction in semiconductors and epitaxic structures by reciprocal-space analysis Sérgio L. Morelhão, E. Abramof Journal of Applied Crystallography Optical MaterialsEngineeringSemiconductor NanostructuresSemiconductorsX-ray Imaging	1999	32
Preservation of pristine Bi<sub>2</sub>Te<sub>3</sub> thin film topological insulator surface after <i>ex situ</i> mechanical removal of Te capping layer Celso I. Fornari, P. H. O. Rappl, Sérgio L. Morelhão, APL Materials EngineeringTopological MaterialsThin Film Process TechnologyMagnetic Topological InsulatorEpitaxial Growth	2016	32
Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111) Philipp Kagerer, Celso I. Fornari, Sebastian Buchberger, Journal of Applied Physics EngineeringChemistryMagnetoresistanceMagnetismMnbi2te4 Single Crystals	2020	31
Dislocations in dendritic web silicon Sérgio L. Morelhão, J. Härtwig, D.L. Meier Journal of Crystal Growth Dislocation InteractionDendritic Web SiliconApplied PhysicsDefect FormationSilicon On Insulator	2000	30
Bragg-surface dynamical diffraction L. H. Avanci, Sérgio L. Morelhão Acta Crystallographica Section A Foundations of Crystallography PhotonicsDiffractive OpticEngineeringPhysicsDispersion Surface	2000	29

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