Andrew E. Carlson

Large-Scale SRAM Variability Characterization in 45 nm CMOS

Zheng Guo, Andrew E. Carlson, Liang-Teck Pang et al. · IEEE Journal of Solid-State Circuits · 2009 · 160 citations

Reliability, Electrical Engineering, Engineering +14

SRAM Read/Write Margin Enhancements Using FinFETs

Andrew E. Carlson, Zheng Guo, Sriram Balasubramanian et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2009 · 70 citations

Sub-threshold Leakage, Electrical Engineering, Engineering +11

Large-scale read/write margin measurement in 45nm CMOS SRAM arrays

Zheng Guo, Andrew E. Carlson, Liang-Teck Pang et al. · 2008 · 51 citations

FinFET SRAM with Enhanced Read / Write Margins

Andrew E. Carlson, Zheng Guo, S. Balasubramanian et al. · 2006 · 42 citations

Gate Workfunction, Non-volatile Memory, Electrical Engineering +14

Device and Circuit Techniques for Reducing Variation in Nanoscale SRAM

Andrew E. Carlson · UC Berkeley · 2008 · 36 citations