T. Göddenhenrich

Force microscope with capacitive displacement detection

T. Göddenhenrich, H. Lemke, Uwe Hartmann et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 140 citations

Magnetic Recording Medium, Force Resolution, Force Microscope +12

Improved microtips for scanning probe microscopy

H. Lemke, T. Göddenhenrich, Hans-Peter Bochem et al. · Review of Scientific Instruments · 1990 · 93 citations

Materials Science, Afm Cantilevers, Engineering +15

Investigation of Bloch wall fine structures by magnetic force microscopy

T. Göddenhenrich, Uwe Hartmann, Mark Anders et al. · Journal of Microscopy · 1988 · 69 citations

Magnetic Properties, Engineering, Mfm Data +25

Probe calibration in magnetic force microscopy

T. Göddenhenrich, H. Lemke, Michael Mück et al. · Applied Physics Letters · 1990 · 63 citations

Engineering, Probe Calibration, Microscopy +18

A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope

T. Göddenhenrich, Sabina Müller, C. Heiden · Review of Scientific Instruments · 1994 · 59 citations

Engineering, Microscopy, Mechanical Engineering +19