R. D. Blanton

Development of a MEMS testing methodology

A. Kolpekwar, R. D. Blanton · 2002 · 67 citations

Engineering, Manufacturing Engineering, Mechanical Engineering +17

Defect Modeling Using Fault Tuples

R. D. Blanton, K.N. Dwarakanath, Rao Desineni · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006 · 36 citations

Engineering, Computer Engineering, Computer Science +16

Deformations of ic structure in test and yield learning

W. Maly, Anne Gattiker, T. Zanon et al. · 2004 · 35 citations

Computing, Computer Engineering, Computer Science +14

Precise failure localization using automated layout analysis of diagnosis candidates

Wing Chiu Tam, Osei Poku, R. D. Blanton · 2008 · 30 citations

Computing, Computer Engineering, Diagnostic Reasoning +13

LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering

Wing Chiu Tam, R. D. Blanton · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2015 · 27 citations

Engineering, Computer Engineering, Design Automation +12