Joanna Wasyluk

Composition and strain in thin Si1−xGex virtual substrates measured by micro-Raman spectroscopy and x-ray diffraction

T. S. Perova, Joanna Wasyluk, K. Lyutovich et al. · Journal of Applied Physics · 2011 · 85 citations · Full text

Materials Science, Epitaxial Growth, Micro-raman Spectroscopy +13

Raman Investigation of Different Polytypes in SiC Thin Films Grown by Solid-Gas Phase Epitaxy on Si (111) and 6H-SiC Substrates

Joanna Wasyluk, T. S. Perova, Nikolay A. Feoktistov et al. · Materials science forum · 2010 · 66 citations

Engineering, Sic Films, Optical Properties +17

Micro-Raman Mapping of 3C-SiC Thin Films Grown by Solid–Gas Phase Epitaxy on Si (111)

T. S. Perova, Joanna Wasyluk, A. V. Osipov et al. · Nanoscale Research Letters · 2010 · 43 citations · Full text

Microstructural investigation supporting an abrupt stress induced transformation in amorphous carbon films

Desmond W. M. Lau, J. G. Partridge, Matthew Taylor et al. · Journal of Applied Physics · 2009 · 23 citations · Full text

Engineering, Severe Plastic Deformation, Carbon Thin Films +21

Micro-Raman investigation of stress distribution in laser drilled via structures

Joanna Wasyluk, David Adley, T. S. Perova et al. · Applied Surface Science · 2008 · 12 citations

Materials Science, Advanced Laser Processing, Micro-raman Investigation +7