Thomas A. Berfield

Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation

Thomas A. Berfield, Jay Patel, Robert G. Shimmin et al. · Experimental Mechanics · 2007 · 232 citations

Materials Science, Geometric Modeling, Engineering +13

Residual stress effects on piezoelectric response of sol-gel derived lead zirconate titanate thin films

Thomas A. Berfield, R. J. Ong, David A. Payne et al. · Journal of Applied Physics · 2007 · 85 citations · Full text

Materials Science, Piezoelectric Response, Engineering +13

Fluorescent Image Correlation for Nanoscale Deformation Measurements

Thomas A. Berfield, Jay Patel, Robert G. Shimmin et al. · Small · 2006 · 77 citations

Engineering, Fluorescent Image Correlation, Microscopy +19

Effects of in-situ poling and process parameters on fused filament fabrication printed PVDF sheet mechanical and electrical properties

Daniel Porter, Trung V.T. Hoang, Thomas A. Berfield · Additive manufacturing · 2016 · 75 citations

Materials Science, Fibre-reinforced Plastic, In-situ Poling +10

In-situ characterization of strain in lithium battery working electrodes

Jubin Chen, Arjun Thapa, Thomas A. Berfield · Journal of Power Sources · 2014 · 54 citations

Materials Science, Electric Battery, Engineering +7