Bappaditya Dey

Deep learning-based defect classification and detection in SEM images

Bappaditya Dey, Dipam Goswami, Sandip Halder et al. · Metrology, Inspection, and Process Control XXXVI · 2022 · 28 citations · Full text

SEM image denoising with unsupervised machine learning for better defect inspection and metrology

Bappaditya Dey, Sandip Halder, Kasem Khalil et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 2021 · 24 citations

Engineering, Machine Learning, Autoencoders +21

Deep learning based defect classification and detection in SEM images: a mask R-CNN approach

Bappaditya Dey, Enrique Dehaerne, Sandip Halder et al. · Metrology, Inspection, and Process Control XXXVI · 2022 · 19 citations · Full text

A Novel Design Gate based Low-Cost Configurable RO PUF using Reversible Logic

Bappaditya Dey, Kasem Khalil, Ashok Kumar et al. · 2019 · 18 citations

Reversible Logic, Engineering, Novel Design Gate +18

Optimizing YOLOv7 for semiconductor defect detection

Enrique Dehaerne, Bappaditya Dey, Sandip Halder et al. · 2023 · 18 citations · Full text