Statistics
Publications
1
Citations
11
H-Index
1
Active since
2020
Affiliations
Technische Universität Berlin(Current)
Alik Sargsyan is an author at Technische Universität Berlin specializing in anomaly detection, computer vision, and image anomaly detection.
Publications per year
2020–2020
1
1
Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering
Jan Lehr, Alik Sargsyan, Martin Pape et al. · 2020 · 11 citations
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