Hans F. Wardenga

In Situ Hall Effect Monitoring of Vacuum Annealing of In2O3:H Thin Films

Hans F. Wardenga, Mareike Frischbier, Monica Morales‐Masis et al. · Materials · 2015 · 57 citations · Full text

Natural Sciences, Materials Science, Physics +15

Influence of dopant species and concentration on grain boundary scattering in degenerately doped In2O3 thin films

Mareike Frischbier, Hans F. Wardenga, Mirko Weidner et al. · Thin Solid Films · 2016 · 52 citations

Natural Sciences, Materials Science, Physics +16

Surface potentials of (111), (110) and (100) oriented CeO 2−x thin films

Hans F. Wardenga, Andreas Klein · Applied Surface Science · 2016 · 49 citations

Natural Sciences, Chemistry, Materials Science +16

Influence of grain boundaries and interfaces on the electronic structure of polycrystalline CuO thin films

Jan Morasch, Hans F. Wardenga, Wolfram Jaegermann et al. · physica status solidi (a) · 2016 · 36 citations

Engineering, Materials Science, Physics +17

Highly conductive grain boundaries in copper oxide thin films

Jonas Deuermeier, Hans F. Wardenga, Jan Morasch et al. · Journal of Applied Physics · 2016 · 27 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17