Sang‐Hee Ko Park

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

Himchan Oh, Sung‐Min Yoon, Min Ki Ryu et al. · Applied Physics Letters · 2010 · 346 citations

Wide-bandgap Semiconductor, Engineering, Optoelectronic Devices +17

Transparent p-type SnOx thin film transistors produced by reactive rf magnetron sputtering followed by low temperature annealing

Elvira Fortunato, Raquel Barros, Pedro Barquinha et al. · Applied Physics Letters · 2010 · 305 citations

Engineering, Semiconductor Materials, Optoelectronic Devices +21

An ‘aqueous route’ for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates

Young Hwan Hwang, Jin-Suk Seo, Je Moon Yun et al. · NPG Asia Materials · 2013 · 233 citations · Full text

Engineering, Post Annealing, Optoelectronic Devices +21

Thin-film transistors based on p-type Cu2O thin films produced at room temperature

Elvira Fortunato, Vitor Figueiredo, Pedro Barquinha et al. · Applied Physics Letters · 2010 · 193 citations · Full text

Engineering, Thin Film Process Technology, Semiconductor Device +16

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

Kwang Hwan Ji, Yeon‐Gon Mo, Jong Han Jeong et al. · IEEE Electron Device Letters · 2010 · 181 citations

Thin-film Transistor, Engineering, Igzo Transistors +16