Jan Weser

Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation

Burkhard Beckhoff, R. Fliegauf, Michael Kolbe et al. · Analytical Chemistry · 2007 · 119 citations

Natural Sciences, Materials Engineering, Materials Science +16

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Janin Lubeck, Burkhard Beckhoff, R. Fliegauf et al. · Review of Scientific Instruments · 2013 · 111 citations

Natural Sciences, Chemistry, Analytical Chemistry +16

High-accuracy EUV metrology of PTB using synchrotron radiation

Frank Scholze, Burkhard Beckhoff, G. Mirek Brandt et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 80 citations

Engineering, Nuclear Engineering, Instrumentation +13

<title>New PTB beamlines for high-accuracy EUV reflectometry at BESSY II</title>

Frank Scholze, Burkhard Beckhoff, G. Mirek Brandt et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 33 citations

Natural Sciences, Physics, Optics +9

Characterization of an Nb/Al/AlOx/Al/Nb superconducting tunnel junction detector with a very high spatial resolution in the soft X-ray range

S. Bechstein, Burkhard Beckhoff, R. Fliegauf et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2004 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +16