Statistics
Publications
26
Citations
993
H-Index
14
Active since
2002
Norman Uhlmann is an author at Fraunhofer Institute for Integrated Circuits specializing in diagnostic imaging, natural sciences, and materials science.
Publications per year
2002–2023
26
26
X-ray based methods for non-destructive testing and material characterization
Randolf Hanke, Theobald Fuchs, Norman Uhlmann · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2008 · 249 citations
Natural Sciences, Materials Engineering, Materials Science +14
Semiautomated 3D Root Segmentation and Evaluation Based on X-Ray CT Imagery
Stefan Gerth, Joelle Claußen, Anja Eggert et al. · Plant Phenomics · 2021 · 52 citations · Full text
Peter J. Wellmann, Georg Neubauer, Lars Fahlbusch et al. · Crystal Research and Technology · 2014 · 42 citations
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