Lili Ding

Enhancement of Transistor-to-Transistor Variability Due to Total Dose Effects in 65-nm MOSFETs

Simone Gerardin, Marta Bagatin, D. Cornale et al. · IEEE Transactions on Nuclear Science · 2015 · 38 citations

Device Modeling, Random Dopant Fluctuations, Electrical Engineering +14

Modeling the Dependence of Single-Event Transients on Strike Location for Circuit-Level Simulation

Lili Ding, Wei Chen, Tan Wang et al. · IEEE Transactions on Nuclear Science · 2019 · 32 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +15

Drain Current Collapse in 65 nm pMOS Transistors After Exposure to Grad Dose

Lili Ding, Simone Gerardin, Marta Bagatin et al. · IEEE Transactions on Nuclear Science · 2015 · 26 citations

Device Modeling, Pmos Transistors, Electrical Engineering +13

Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC

N. Demaria, M. Barbero, D. Fougeron et al. · Journal of Instrumentation · 2016 · 26 citations · Full text

CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments

N. Demaria, G. Dellacasa, G. Mazza et al. · 2015 · 25 citations

Engineering, Vlsi Design, Image Sensor +19