Statistics
Publications
1
Citations
26
H-Index
1
Active since
2004
Affiliations
IBM (United States)(Current)
J. Walko is an author at IBM (United States) specializing in semiconductor devices, reliability degradation mechanisms, and device modeling.
Publications per year
2004–2004
1
1
RF S-parameter degradation under hot carrier stress
J. Walko, B. Abadeer · 2004 · 26 citations
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