A. J. M. Duisenberg

An intensity evaluation method:<i>EVAL</i>-14

A. J. M. Duisenberg, Loes M. J. Kroon-Batenburg, A.M.M. Schreurs · Journal of Applied Crystallography · 2003 · 1.1K citations

Natural Sciences, Materials Science, Crystal Structure +16

Indexing in single-crystal diffractometry with an obstinate list of reflections

A. J. M. Duisenberg · Journal of Applied Crystallography · 1992 · 849 citations

Natural Sciences, Computer Science, Computational Geometry +16

Accurate cells from area-detector images

A. J. M. Duisenberg, Rob Hooft, A.M.M. Schreurs et al. · Journal of Applied Crystallography · 2000 · 273 citations

Natural Sciences, Chemistry, Physics +10

Diffractometer software (<i>CAD4F</i>)

J. L. de Boer, A. J. M. Duisenberg · Acta Crystallographica Section A Foundations of Crystallography · 1984 · 99 citations · Full text

Natural Sciences, Materials Science, Computational Geometry +10

<i>STRATEGY</i>: a program to optimize the starting spindle angle and scan range for X-ray data collection

Raimond B. G. Ravelli, Robert M. Sweet, John M. Skinner et al. · Journal of Applied Crystallography · 1997 · 58 citations

Natural Sciences, Chemistry, Analytical Chemistry +16