Statistics
Publications
1
Citations
75
H-Index
1
Active since
2015
Affiliations
KU Leuven(Current)
J. Joel is an author at KU Leuven specializing in charge carrier density, interface trap density, and interface trap density measurement.
Publications per year
2015–2015
1
1
Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface
Ratan Kotipalli, Bart Vermang, J. Joel et al. · AIP Advances · 2015 · 75 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
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