S. I. Zheludeva

Total reflection X-ray fluorescence study of Langmuir monolayers on water surface

S. I. Zheludeva, Oleg Konovalov, M. V. Kovalchuk et al. · Journal of Applied Crystallography · 2003 · 34 citations

Langmuir Monolayers, Sr Beamline Id10b, Engineering +16

X-ray Standing Waves in X-ray Specular Reflection and Fluorescence Study of Nano-Films

S. I. Zheludeva, M. V. Kovalchuk, A.N. Sosphenov et al. · Journal of Applied Crystallography · 1997 · 34 citations

X-ray Spectroscopy, Engineering, Wavefield Intensity Distribution +22

Thickness and density determination of ultrathin solid films comprising multilayer x-ray mirrors by x-ray reflection and fluorescence study

S. I. Zheludeva, M. V. Kovalchuk, I. V. Bashelhanov et al. · Review of Scientific Instruments · 1992 · 22 citations

Optical Materials, X-ray Spectroscopy, Engineering +18

X-ray fluorescence methods for investigations of lipid/protein membrane models

É. A. Yurieva, S. I. Zheludeva, M. V. Kovalchuk et al. · Journal of Synchrotron Radiation · 2005 · 20 citations · Full text

X-ray Crystallography, Proteinlipid Interaction, Lead Identification +16

Total reflection X-ray fluorescence study of organic nanostructures

S. I. Zheludeva, M. V. Kovalchuk · Spectrochimica Acta Part B Atomic Spectroscopy · 2001 · 16 citations

Organic Material Chemistry, Organic Nanostructures, Chemistry +1