M. Bischof

Exploring the Limits of N-Type Ultra-Shallow Junction Formation

Craig Polley, W. R. Clarke, Jill A. Miwa et al. · ACS Nano · 2013 · 51 citations

Engineering, Electrical Engineering, Physics +17

Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography

Scott Schmucker, Navneet Kumar, John R. Abelson et al. · Nature Communications · 2012 · 48 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Load-dependent high temperature tribological properties of silver tantalate coatings

D. S. Stone, Hongyu Gao, Chirawat Chantharangsi et al. · Surface and Coatings Technology · 2014 · 31 citations

Natural Sciences, Materials Engineering, Materials Science +14

Pattern transfer of hydrogen depassivation lithography patterns into silicon with atomically traceable placement and size control

Joshua B. Ballard, James H. G. Owen, William R. Owen et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2014 · 24 citations

Engineering, Materials Engineering, Materials Science +17

Reconstruction mechanisms of tantalum oxide coatings with low concentrations of silver for high temperature tribological applications

D. S. Stone, Hongyu Gao, Chirawat Chantharangsi et al. · Applied Physics Letters · 2014 · 23 citations · Full text

Engineering, Materials Engineering, Materials Science +17