OmerFaruk Karadavut

Defect characterization and charge transport measurements in high-resolution Ni/n-4H-SiC Schottky barrier radiation detectors fabricated on 250 <i>μ</i>m epitaxial layers

Joshua W. Kleppinger, Sandeep K. Chaudhuri, OmerFaruk Karadavut et al. · Journal of Applied Physics · 2021 · 49 citations · Full text

Semiconductors, Best Resolution Detector, Electrical Engineering +14

Quaternary Semiconductor Cd1−xZnxTe1−ySey for High-Resolution, Room-Temperature Gamma-Ray Detection

Sandeep K. Chaudhuri, Joshua W. Kleppinger, OmerFaruk Karadavut et al. · Crystals · 2021 · 29 citations · Full text

X-ray Crystallography, Engineering, Crystal Growth Technology +16

Role of deep levels and barrier height lowering in current-flow mechanism in 150 <i>μ</i>m thick epitaxial n-type 4H–SiC Schottky barrier radiation detectors

Joshua W. Kleppinger, Sandeep K. Chaudhuri, OmerFaruk Karadavut et al. · Applied Physics Letters · 2021 · 24 citations · Full text

Semiconductors, Semiconductor Technology, Electrical Engineering +13

High-resolution radiation detection using Ni/SiO2/n-4H-SiC vertical metal-oxide-semiconductor capacitor

Sandeep K. Chaudhuri, OmerFaruk Karadavut, Joshua W. Kleppinger et al. · Journal of Applied Physics · 2021 · 23 citations · Full text

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Deep-Level Transient Spectroscopy and Radiation Detection Performance Studies on Neutron Irradiated 250-<i>μ</i>m-Thick 4H-SiC Epitaxial Layers

Joshua W. Kleppinger, Sandeep K. Chaudhuri, OmerFaruk Karadavut et al. · IEEE Transactions on Nuclear Science · 2022 · 16 citations

Neutron Fluence, Nuclear Physics, Engineering +16