Gevork S. Gevorkyan

Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes

Gevork S. Gevorkyan, Siddharth Karkare, Sahand Emamian et al. · Physical Review Accelerators and Beams · 2018 · 33 citations · Full text

Ultrafast Electron Diffraction, Engineering, Electron-beam Lithography +19

The ALS OSMS: Optical Surface Measuring System for high accuracy two-dimensional slope metrology with state-of-the-art x-ray mirrors

Ian Lacey, Kevan Anderson, Gary P. Centers et al. · 2018 · 17 citations · Full text

Surface Slope, Engineering, Measurement +24

<i> <b>Ex situ</b> </i> metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source

Valeriy V. Yashchuk, Ian Lacey, Gevork S. Gevorkyan et al. · Review of Scientific Instruments · 2019 · 13 citations · Full text

Optical Materials, Engineering, Optic Design +24

Correlation methods in optical metrology with state-of-the-art x-ray mirrors

Valeriy V. Yashchuk, Gary P. Centers, Gevork S. Gevorkyan et al. · 2018 · 12 citations

Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics

Ian Lacey, J. Adam, Gary P. Centers et al. · 2017 · 11 citations