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Publications
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Citations
13
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Active since
2012
David de la Fuente Sánchez is an author specializing in leakage current analysis, device reliability, and microelectronics.
Publications per year
2012–2012
Estimation of Time to PID-Failure by Characterisation of Module Leakage Currents
P. Lechner, David de la Fuente Sánchez, Dominique Geyer et al. · EU PVSEC · 2012 · 13 citations · Full text
Engineering, Electrical Engineering, Microelectronics +9
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