I. R. Barkshire

High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis

I. R. Barkshire, Peter Karduck, Werner P. Rehbach et al. · Microchimica Acta · 2000 · 51 citations

X-ray Spectroscopy, Engineering, Physics +5

A third‐generation Auger microscope using parallel multispectral data acquisition and analysis

M. Prutton, C.G.H. Walker, J. C. Greenwood et al. · Surface and Interface Analysis · 1991 · 50 citations

Multi-spectral scanning Auger microscopy of tribological surfaces

I. R. Barkshire, M. Prutton, Graham C. Smith · Applied Surface Science · 1995 · 21 citations

Materials Science, Tribological Coating, Engineering +7

Three-dimensional scatter diagrams: application to surface analytical microscopy

P. G. Kenny, I. R. Barkshire, M. Prutton · Ultramicroscopy · 1994 · 20 citations

Geometric Modeling, Microscopy, Microscopy Method +6

The use of metal/semiconductor structures to develop MULSAM analytical techniques

M. Prutton, I. R. Barkshire, M. M. El Gomati et al. · Surface and Interface Analysis · 1992 · 16 citations

Engineering, Electron-beam Lithography, Microscopy +16