P. Zanola

Glancing-incidence X-ray diffraction for depth profiling of polycrystalline layers

Paolo Colombi, P. Zanola, Elza Bontempi et al. · Journal of Applied Crystallography · 2006 · 50 citations

Materials Science, Materials Engineering, Glancing-incidence X-ray Diffraction +13

Modeling of glancing incidence X-ray for depth profiling of thin layers

Paolo Colombi, P. Zanola, Elza Bontempi et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2007 · 23 citations

Geometric Modeling, Thin Layers, X-ray Spectroscopy +15

Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer

Elza Bontempi, P. Zanola, Marcello Gelfi et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 12 citations · Full text

Materials Science, Engineering, Titanium Dioxide Films +11

Laboratory Microbeam Analysis Applied to Cultural Heritage Studies

D. Benedetti, Ivano Alessandri, Paolo Bergese et al. · Microchimica Acta · 2006 · 10 citations

Cultural Heritage Studies, Microscopy, Cultural Heritage +2