Rüdiger Rosenkranz

Lateral damage in graphene carved by high energy focused gallium ion beams

Zhongquan Liao, Martin Gall, Arezoo Dianat et al. · Applied Physics Letters · 2015 · 32 citations

Natural Sciences, Materials Science, Physics +15

Laboratory Computed X-Ray Tomography – A Nondestructive Technique for 3D Microstructure Analyis of Materials

Ehrenfried Zschech, Markus Löffler, P. Krüger et al. · Practical Metallography · 2018 · 29 citations

Natural Sciences, Materials Engineering, Materials Science +16

Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to AlGaN/GaN layers

Aránzazu Garitagoitia Cid, Rüdiger Rosenkranz, Markus Löffler et al. · Ultramicroscopy · 2018 · 15 citations

Engineering, Materials Engineering, Materials Science +12

Optimization of the SEM Working Conditions: EsB Detector at Low Voltage

Aránzazu Garitagoitia Cid, Rüdiger Rosenkranz, Ehrenfried Zschech · Advanced Engineering Materials · 2015 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +13