L. J. Chen

Cross-sectional transmission electron microscope study of residual defects in BF+2-implanted (001)Si

C. W. Nieh, L. J. Chen · Journal of Applied Physics · 1986 · 51 citations

Engineering, Silicon On Insulator, Defect Tolerance +16

Mechanism of enhanced formation of C54–TiSi2 in high-temperature deposited Ti thin films on preamorphized (001)Si

Sue-min Chang, H. Y. Huang, Hiswen Yang et al. · Applied Physics Letters · 1999 · 40 citations

Materials Science, Engineering, Crystalline Defects +10

Electrical and microstructural characteristics of Ti contacts on (001)Si

H. R. Liauh, M. C. Chen, J. F. Chen et al. · Journal of Applied Physics · 1993 · 40 citations

Materials Engineering, Materials Science, Electrical Engineering +15

Partial epitaxial growth of cobalt germanides on (111)Ge

Y. F. Hsieh, L. J. Chen, E. D. Marshall et al. · Applied Physics Letters · 1987 · 36 citations

Engineering, Epitaxial Co5ge7, Electron Microscopy +16

Effects of stress on the growth of TiSi2 thin films on (001)Si

Soofin Cheng, H. Y. Huang, Yin-Wei Peng et al. · Applied Physics Letters · 1999 · 15 citations

Materials Science, Engineering, Tisi2 Thin Films +13