Y. Syryanyy

Effect of argon sputtering on XPS depth-profiling results of Si/Nb/Si

I.N. Demchenko, Yevgen Melikhov, Y. Syryanyy et al. · Journal of Electron Spectroscopy and Related Phenomena · 2017 · 45 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +7

Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

Igor A. Makhotkin, R. Sobierajski, J. Chalupský et al. · Journal of Synchrotron Radiation · 2017 · 23 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Point Defects in Silicon-Doped β-Ga₂O₃: Hybrid-DFT Calculations

Asiye Shokri, Yevgen Melikhov, Y. Syryanyy et al. · ACS Omega · 2023 · 17 citations · Full text

Natural Sciences, Materials Science, Physics +17

X-ray photoelectron spectroscopy analysis as a tool to assess factors influencing magnetic anisotropy type in Co/MgO system with gold interlayer

I.N. Demchenko, Y. Syryanyy, Yevgen Melikhov et al. · Scripta Materialia · 2017 · 16 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

Redistribution of Tb and Eu ions in ZnO films grown on different substrates under thermal annealing and its impact on Tb-Eu energy transfer

N. Korsunska, L. Borkovska, L. Khomenkova et al. · Applied Surface Science · 2020 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +17