Statistics
Publications
1
Citations
15
H-Index
1
Active since
2002
Affiliations
Intel (United States)(Current)
Y.-H. Lee is an author at Intel (United States) specializing in electrical insulation, electrical engineering, and materials engineering.
Publications per year
2002–2002
1
1
Via delamination-a novel electromigration failure mechanism
Y.-H. Lee, Kuei-Sheng Wu, Nicole Mielke et al. · 2002 · 15 citations
Materials Science, Materials Engineering, Electrical Engineering +14
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