Matthew T. Simons

Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon et al. · Journal of Applied Physics · 2017 · 236 citations

Rf Electric Field, Engineering, Atomic Emission Spectroscopy +23

A Rydberg atom-based mixer: Measuring the phase of a radio frequency wave

Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon et al. · Applied Physics Letters · 2019 · 231 citations

Engineering, Far-field Measurement, Physics +11

Using frequency detuning to improve the sensitivity of electric field measurements via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms

Matthew T. Simons, Joshua A. Gordon, Christopher L. Holloway et al. · Applied Physics Letters · 2016 · 149 citations

Engineering, Radio Frequency, Atomic Emission Spectroscopy +23

Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging

Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon et al. · IEEE Transactions on Electromagnetic Compatibility · 2017 · 148 citations

Engineering, Atomic Emission Spectroscopy, Absorption Spectroscopy +20

Determining the angle-of-arrival of a radio-frequency source with a Rydberg atom-based sensor

Amy K. Robinson, Nikunjkumar Prajapati, Damir Senić et al. · Applied Physics Letters · 2021 · 148 citations · Full text

Radar, Microwave Spectroscopy, Engineering +15