Concepedia

Alain Kueng

AK

2

Publications

170

Citations

2

H-Index

2005

Active since

Affiliations

Swiss Federal Institute of Metrology(Current)

Alain Kueng is an author at Swiss Federal Institute of Metrology specializing in measurement, engineering, and calibration.

Top concepts

CalibrationEngineeringMeasurementEducationMicroscopyMechatronicsApplied PhysicsInstrumentationMicrofabricationOptical Metrology

Publications per year

2005–2009

2

Publications

2

Ultra precision micro-CMM using a low force 3D touch probe

Felix Meli, Alain Kueng, R. Thalmann · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 155 citations

Engineering, Probe Head, Microscopy +20

Report on an international comparison of one-dimensional (1D) grating pitch

J E Decker, Egbert Buhr, Alexander C. Diener et al. · Metrologia · 2009 · 15 citations

Optical Diffraction, Engineering, Measurement +6

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