Elena Castilla

Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution

N. Balakrishnan, Elena Castilla, Nirian Martín et al. · IEEE Transactions on Information Theory · 2019 · 41 citations

New Family, Exponential Distribution, Z-type Test Statistics +12

Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model

N. Balakrishnan, Elena Castilla, Nirian Martín et al. · IEEE Transactions on Reliability · 2019 · 35 citations

Engineering, Life Prediction, Robustness Testing +16

Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

N. Balakrishnan, Elena Castilla, Nirian Martín et al. · Metrika · 2019 · 31 citations

Gamma Lifetime Model, Engineering, Robust Statistic +10

Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis

N. Balakrishnan, Elena Castilla, Man Ho Ling · Quality and Reliability Engineering International · 2021 · 28 citations · Full text

Engineering, Measurement, Life Prediction +20

Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses

N. Balakrishnan, Elena Castilla, Nirian Martín et al. · Quality and Reliability Engineering International · 2020 · 21 citations

Exponential Lifetime Model, Reliability Engineering, Engineering +11