Neil A. Beaudry

Dielectric tensor measurement from a single Mueller matrix image

Neil A. Beaudry, Yanming Zhao, Russell A. Chipman · Journal of the Optical Society of America A · 2007 · 40 citations

Optical Engineering, Dielectric Tensor Measurement, Optical Materials +18

Effects of mask roughness and condenser scattering in EUVL systems

Neil A. Beaudry, Tomas D. Milster · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 34 citations

Optical Materials, Engineering, Microscopy +17

An integrated multiangle, multispectral, and polarimetric imaging concept for aerosol remote sensing from space

David J. Diner, Russell A. Chipman, Neil A. Beaudry et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 34 citations

Engineering, Multispectral Imaging, Earth Science +16

Effects of object roughness on partially coherent image formation

Neil A. Beaudry, Tom D. Milster · Optics Letters · 2000 · 18 citations

Evanescent-imaging-ellipsometry-based microarray reader

Srivatsa Venkatasubbarao, Neil A. Beaudry, Yanming Zhao et al. · Journal of Biomedical Optics · 2006 · 11 citations · Full text

Polarization Change, Engineering, Biomedical Imaging +7