Concepedia
Author
Ronald Tararan
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1
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167
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A polaronic stacking fault defect model for CaCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub>material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features
Paulo R. Bueno, Ronald Tararan, Rodrigo Parra, +5
Journal of Physics D Applied Physics
2009
Page 1