Statistics
Publications
21
Citations
499
H-Index
14
Active since
2010
Xiaowen Shi is an author at University College London specializing in natural sciences, materials science, and x-ray diffraction.
Publications per year
2010–2024
21
21
Evaluation of partial coherence correction in X-ray ptychography
Nicolas Burdet, Xiaowen Shi, Daniel Parks et al. · Optics Express · 2015 · 43 citations · Full text
Near-edge X-ray refraction fine structure microscopy
Maryam Farmand, Richard Celestre, P. Denes et al. · Applied Physics Letters · 2017 · 43 citations · Full text
Ana Katrina Estandarte, Jiecheng Diao, Alice V. Llewellyn et al. · ACS Nano · 2020 · 38 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
X-ray ptychography on low-dimensional hard-condensed matter materials
Xiaowen Shi, Nicolas Burdet, Bo Chen et al. · Applied Physics Reviews · 2019 · 35 citations · Full text
1–5 of 21