L M Heikkinen

The Bayesian approximation error approach for electrical impedance tomography—experimental results

A Nissinen, L M Heikkinen, Jari P. Kaipio · Measurement Science and Technology · 2007 · 114 citations

Computed Tomography, Numerical Analysis, Image Reconstruction +20

Suitability of a PXI platform for an electrical impedance tomography system

Jari Kourunen, Tuomo Savolainen, A. Lehikoinen et al. · Measurement Science and Technology · 2008 · 113 citations

Computed Tomography, Engineering, Measurement +18

Compensation of errors due to discretization, domain truncation and unknown contact impedances in electrical impedance tomography

A Nissinen, L M Heikkinen, Ville Kolehmainen et al. · Measurement Science and Technology · 2009 · 102 citations

Computed Tomography, Numerical Analysis, Image Reconstruction +23

Simultaneous reconstruction of electrode contact impedances and internal electrical properties: II. Laboratory experiments

L M Heikkinen, Tanja Vilhunen, Robert West et al. · Measurement Science and Technology · 2002 · 98 citations

Electrical Engineering, Internal Electrical Properties, Engineering +15

Approximation errors and truncation of computational domains with application to geophysical tomography

A. Lehikoinen, Stefan Finsterle, Arto Voutilainen et al. · Inverse Problems and Imaging · 2007 · 69 citations

Numerical Analysis, Image Reconstruction, Engineering +24