Concepedia

Viktor Zekeriya

VZ

Statistics

Publications

6

Citations

233

H-Index

6

Active since

1983

Affiliations

Yale University(Current)

Viktor Zekeriya is an author at Yale University specializing in applied physics, physics, and microelectronics.

Top concepts

PhysicsEngineeringApplied PhysicsMicroelectronicsNanoelectronicsMaterial ScienceElectrical EngineeringMicrostructureMaterials EngineeringRadiation Dose

Publications per year

1983–1985

6

Publications

6

Dependence of X-Ray Generation of Interface Traps on Gate Metal Induced Interfacial Stress in MOS Structures

Viktor Zekeriya, T-P. Ma · IEEE Transactions on Nuclear Science · 1984 · 80 citations

Materials Science, Materials Engineering, Interface Structure +15

Dependence of radiation-induced interface traps on gate Al thickness in metal/SiO2/Si structures

Viktor Zekeriya, T-P. Ma · Journal of Applied Physics · 1984 · 47 citations

Engineering, Gate Al Thickness, Integrated Circuits +19

Effect of stress relaxation on the generation of radiation-induced interface traps in post-metal-annealed Al-SiO2-Si devices

Viktor Zekeriya, T-P. Ma · Applied Physics Letters · 1984 · 45 citations

Engineering, Silicon On Insulator, Post-metal-annealed Al-sio2-si Devices +17

Dependence of radiation-induced interface traps on gate electrode material in metal/SiO2/Si devices

Viktor Zekeriya, T-P. Ma · Applied Physics Letters · 1985 · 26 citations

Gate Electrode Material, Electrical Engineering, Oxide Process +14

Interface traps generated by internal photoemission in Al-SiO2-Si structures

Viktor Zekeriya, T. P. · Applied Physics Letters · 1983 · 25 citations

Electrical Engineering, Ion Implantation, Engineering +12

1–5 of 6