Christophe Secouard

Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cyril Cayron, M. den Hertog, L. Latu‐Romain et al. · Journal of Applied Crystallography · 2009 · 92 citations · Full text

Silicon Nanowires, Engineering, Silicon On Insulator +18

Role of the chemical composition and structure on the electrical properties of a solid state electrolyte: Case of a highly conductive LiPON

Lucie Le Van‐Jodin, A. Claudel, Christophe Secouard et al. · Electrochimica Acta · 2017 · 47 citations

Materials Science, Electrolytes, Chemical Engineering +11

Complete elastic characterization of lithium phosphorous oxynitride films using picosecond ultrasonics

Feng Xu, L. Belliard, Danièle Fournier et al. · Thin Solid Films · 2013 · 35 citations

Materials Science, Material Analysis, Engineering +8

Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM

Arnaud Bordes, Éric De Vito, Cédric Haon et al. · ACS Applied Materials & Interfaces · 2015 · 30 citations

Engineering, Chemistry, Silicon On Insulator +18

Ex situ and operando study of LiCoO₂ thin films by Raman spectroscopy: Thermal and electrochemical properties

Lucie Le Van‐Jodin, D. Rouchon, Van‐Hoan Le et al. · Journal of Raman Spectroscopy · 2019 · 18 citations

Engineering, Chemistry, Chemical Engineering +20