K.-M. Mahlein

Progress of MCT Detector Technology at AIM Towards Smaller Pitch and Lower Dark Current

D. Eich, W. Schirmacher, Stefan Hanna et al. · Journal of Electronic Materials · 2017 · 32 citations

Mct Detector Technology, Electrical Engineering, Engineering +6

Impact of critical processes on HgCdTe diode performance and yield

Heinrich Figgemeier, M. Bruder, K.-M. Mahlein et al. · Journal of Electronic Materials · 2003 · 23 citations

Critical Processes, Electrical Engineering, Engineering +4

MCT-Based LWIR and VLWIR 2D Focal Plane Detector Arrays for Low Dark Current Applications at AIM

Stefan Hanna, D. Eich, K.-M. Mahlein et al. · Journal of Electronic Materials · 2016 · 20 citations

Electrical Engineering, Engineering, Optical Testing +8

Planar n-on-p HgCdTe FPAs for LWIR and VLWIR Applications

R. Wollrab, Adam Q. Bauer, H. Bitterlich et al. · Journal of Electronic Materials · 2011 · 14 citations

Electrical Engineering, Engineering, Vlsi Design +6

High-performance SWIR/MWIR and MWIR/MWIR bispectral MCT detectors by AIM

Christopher P. Ames, Rainer Breiter, D. Eich et al. · 2018 · 10 citations