29
Publications
888
Citations
17
H-Index
1987
Active since
J. Ben-Arie is an author at University of Illinois Chicago specializing in engineering, pattern recognition, and machine vision.
Top concepts
EngineeringPattern RecognitionImage AnalysisMachine VisionComputer VisionNatural SciencesGeometry ModelingComputational GeometryBiometricsComputer Science
Publications per year
1987–2010
29
29
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1–5 of 29