Concepedia
Statistics
Publications
8
Citations
332
H-Index
Active since
1992
Affiliations
Chimie ParisTech(Current)
Centre National de la Recherche Scientifique
Office National d'Études et de Recherches Aérospatiales
Sorbonne Université
J. M. Siffre is an author at Chimie ParisTech specializing in natural sciences, materials science, and surface science.
Publications per year
1992–2000
An in situ XPS study of sputter-deposited aluminium thin films on graphite
C. Hinnen, D. Imbert, J. M. Siffre et al. · Applied Surface Science · 1994 · 142 citations
Natural Sciences, Materials Engineering, Materials Science +10
XPS study of the adsorption of NH3 on nickel oxide on Ni(111)
Anouk Galtayries, Endang Widjajanti Laksono, J. M. Siffre et al. · Surface and Interface Analysis · 2000 · 41 citations
Natural Sciences, Chemistry, Materials Science +17
Superconductivity and X-ray photoelectron spectroscopy studies of Bi2Sr2-xLaxCaCu2O8+δ
C Nguyen-van-Huong, C. Hinnen, J. M. Siffre · Journal of Materials Science · 1997 · 38 citations
Natural Sciences, Materials Science, Physics +12
An <i>in situ</i> XPS study of the formation of aluminium–polymer interfaces
Philippe Marcus, C. Hinnen, Daniel Imbert et al. · Surface and Interface Analysis · 1992 · 36 citations
Natural Sciences, Materials Engineering, Materials Science +16
Mass Spectrometric Analysis of Reaction Products of Fast Oxygen Atoms-Material Interactions
Bertrand Cazaubon, A. Paillous, J. M. Siffre et al. · Journal of Spacecraft and Rockets · 1998 · 32 citations
Natural Sciences, Aerospace Engineering, Materials Science +17
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