David M. Fryauf

Reflectometry–Ellipsometry Reveals Thickness, Growth Rate, and Phase Composition in Oxidation of Copper

Juan J. Díaz León, David M. Fryauf, Robert D. Cormia et al. · ACS Applied Materials & Interfaces · 2016 · 31 citations

Engineering, Oxidation Resistance, Thin Film Process Technology +18

Phenomenological Model of the Growth of Ultrasmooth Silver Thin Films Deposited with a Germanium Nucleation Layer

Junce Zhang, David M. Fryauf, Matthew Garrett et al. · Langmuir · 2015 · 24 citations

Engineering, Ag Thin Films, Phenomenological Model +16

Progress and new techniques for protected-silver coatings

Andrew C. Phillips, David M. Fryauf, Nobuhiko P. Kobayashi et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014 · 23 citations

Engineering, Optical Coatings, Protected-silver Coatings +17

Corrosion barriers for silver-based telescope mirrors: comparative study of plasma-enhanced atomic layer deposition and reactive evaporation of aluminum oxide

David M. Fryauf, Andrew C. Phillips, Nobuhiko P. Kobayashi · Journal of Astronomical Telescopes Instruments and Systems · 2015 · 18 citations · Full text

Optical Materials, Engineering, Optical Coatings +21

Study of the formation of native oxide on copper at room temperature

Juan J. Díaz León, David M. Fryauf, Robert D. Cormia et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2016 · 15 citations

Optical Materials, Engineering, Oxidation Resistance +16