F.L. Metcalfe

Biassed secondary electron imaging studies of Ag/Si(111)

T. Doust, F.L. Metcalfe, J. A. Venables · Ultramicroscopy · 1989 · 20 citations

Electron Microscopy, Physics, Microscopy +6

Comparisons of Ag deposits on Ge and Si(111)

F.L. Metcalfe, J. A. Venables · Surface Science · 1996 · 17 citations

Engineering, Surface Science, Applied Physics +4

Rate and diffusion analyses of surface processes

J. A. Venables, Rajendra Persaud, F.L. Metcalfe et al. · Journal of Physics and Chemistry of Solids · 1994 · 15 citations

Engineering, Diffusion Resistance, Diffusion Analyses +5

Competing processes and controlling energies at the interface

J. A. Venables, F.L. Metcalfe, Akira Sugawara · Surface Science · 1997 · 14 citations

Interfacial Process, Engineering, Physics +3