Statistics
Publications
1
Citations
73
H-Index
1
Active since
2015
Affiliations
Samsung (South Korea)(Current)
Cheong-sik Yu is an author at Samsung (South Korea) specializing in electrical engineering, soft error reliability, and radiation-tolerant semiconductor devices.
Publications per year
2015–2015
1
1
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Soon Young Lee, Il-Gon Kim, Sungmock Ha et al. · 2015 · 73 citations
Engineering, Computer Engineering, Electrical Engineering +16
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