Yoshiko Nakayama

Thickness measurements with electron energy loss spectroscopy

Konstantin Iakoubovskii, Kazutaka Mitsuishi, Yoshiko Nakayama et al. · Microscopy Research and Technique · 2008 · 238 citations

Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior

Konstantin Iakoubovskii, Kazutaka Mitsuishi, Yoshiko Nakayama et al. · Physical Review B · 2008 · 140 citations

Engineering, Nuclear Physics, Microscopy +22

Zn nanoparticles irradiated with swift heavy ions at low fluences: Optically-detected shape elongation induced by nonoverlapping ion tracks

H. Amekura, N. Ishikawa, N. Okubo et al. · Physical Review B · 2011 · 37 citations

Optical Materials, Engineering, Metal Nanoparticles +17

Ga As ∕ Al Ga As quantum dot laser fabricated on GaAs (311)A substrate by droplet epitaxy

Takaaki Mano, Takashi Kuroda, Kazutaka Mitsuishi et al. · Applied Physics Letters · 2008 · 37 citations

Engineering, Laser Applications, Laser Material +18

Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun

S. Kim, Yoshifumi Oshima, Hidetaka Sawada et al. · Journal of Electron Microscopy · 2011 · 32 citations

Engineering, Microscopy, Silicon Crystal +17